| Specification |
Metric |
Imperial |
| Manufacturer |
BRUKER |
BRUKER |
| Model |
D8 DISCOVER |
D8 DISCOVER |
| Machine Type |
Multi-purpose X-Ray Diffractometer (XRD) |
Multi-purpose X-Ray Diffractometer (XRD) |
| Cooling System |
External Chiller Included |
External Chiller Included |
| TWIST-TUBE X-Ray Source |
| Focus Type |
Point / Line Focus Switching |
Point / Line Focus Switching |
| Available Anodes |
Cr, Cu, Mo, Ag |
Cr, Cu, Mo, Ag |
| Maximum Power |
Up to 3 kW |
Up to 3 kW |
| Filament Size |
0.4 × 16 mm |
0.016 × 0.63 in |
| Patent |
EP 1 923 900 B1 |
EP 1 923 900 B1 |
| IµS Microfocus Source |
| Power Load |
Up to 50 W |
Up to 50 W |
| Power Supply |
Single Phase |
Single Phase |
| Optics |
MONTEL / MONTEL Plus Mirrors |
MONTEL / MONTEL Plus Mirrors |
| Minimum Beam Size |
180 × 180 µm |
0.0071 × 0.0071 in |
| Maximum Integrated Flux |
8 × 10⁸ cps |
8 × 10⁸ cps |
| Beam Divergence |
0.5 mrad |
0.5 mrad |
| Turbo X-Ray Source (TXS) |
| Line Focus |
0.3 × 3 mm |
0.012 × 0.118 in |
| Focal Brightness |
6 kW/mm² |
6 kW/mm² |
| Available Anodes |
Cu, Co, Cr, Mo |
Cu, Co, Cr, Mo |
| Maximum Voltage |
50 kV |
50 kV |
| Maximum Power (Cr) |
3.2 kW |
3.2 kW |
| Maximum Power (Cu / Mo) |
5.4 kW |
5.4 kW |
| Maximum Power (Co) |
2.8 kW |
2.8 kW |
| Filament Type |
Pre-Aligned Tungsten |
Pre-Aligned Tungsten |
| TRIO Optics |
| Beam Geometries |
Motorized Divergence Slit, High Intensity Kα1,2 Parallel Beam, High Resolution Kα1 Parallel Beam |
Motorized Divergence Slit, High Intensity Kα1,2 Parallel Beam, High Resolution Kα1 Parallel Beam |
| Automatic Beam Switching |
Up to 6 Configurations |
Up to 6 Configurations |
| Supported Sample Types |
Powders, Bulk Materials, Fibers, Sheets, Thin Films |
Powders, Bulk Materials, Fibers, Sheets, Thin Films |
| High Resolution Monochromators |
| Crystal Reflections |
Ge(220), Ge(004) |
Ge(220), Ge(004) |
| Configuration |
2-Bounce / 4-Bounce Bartels Type |
2-Bounce / 4-Bounce Bartels Type |
| Mounting System |
SNAP.LOCK Alignment-Free |
SNAP.LOCK Alignment-Free |
| D8 Goniometer |
| Type |
Two-Circle Precision Goniometer |
Two-Circle Precision Goniometer |
| Drive System |
Independent Stepper Motors with Optical Encoders |
Independent Stepper Motors with Optical Encoders |
| Lubrication |
Lifetime Lubricated Maintenance-Free |
Lifetime Lubricated Maintenance-Free |
| UMC Sample Stage |
| X/Y Translation |
±150 mm |
±5.91 in |
| Z Travel |
50 mm |
1.97 in |
| Phi Rotation |
Continuous |
Continuous |
| Maximum Psi Tilt |
55° |
55° |
| Maximum Sample Weight |
50 kg |
110 lbs |
| Centric Eulerian Cradle (CEC) |
| Degrees of Freedom |
5 |
5 |
| X/Y Translation |
±40 mm |
±1.57 in |
| Z Alignment |
Motorized |
Motorized |
| Phi Rotation |
360° |
360° |
| Psi Range |
-11° to 98° |
-11° to 98° |
| Maximum Sample Weight |
1 kg |
2.2 lbs |
| Pathfinder Plus Optics |
| Optics |
Motorized Slit, 2-Bounce Ge Analyzer, Integrated Absorber |
Motorized Slit, 2-Bounce Ge Analyzer, Integrated Absorber |
| Switching |
Fully Automatic |
Fully Automatic |
| LYNXEYE XE-T Detector |
| Energy Resolution |
<380 eV @ 8 keV |
<380 eV @ 8 keV |
| Detection Modes |
0D / 1D / 2D |
0D / 1D / 2D |
| Supported Wavelengths |
Cr, Co, Cu, Mo, Ag |
Cr, Co, Cu, Mo, Ag |
| Detection Speed |
Up to 450× Faster than Conventional Systems |
Up to 450× Faster than Conventional Systems |
| Special Capability |
100% Fe Fluorescence Filtering with Cu Radiation |
100% Fe Fluorescence Filtering with Cu Radiation |
| EIGER2 Detector |
| Technology |
Hybrid Photon Counting |
Hybrid Photon Counting |
| Detection Modes |
0D / 1D / 2D |
0D / 1D / 2D |
| Scanning Modes |
Step, Continuous, Advanced |
Step, Continuous, Advanced |
| Detector Positioning |
Continuously Variable |
Continuously Variable |
| Non-Ambient Capabilities |
| Temperature Range |
Approx. 12 K to 2,500 K |
Approx. -438°F to 4,040°F |
| Pressure Range |
10⁻⁴ mbar to 100 bar |
10⁻⁴ mbar to 1,450 psi |
| Humidity Range |
5% to 95% RH |
5% to 95% RH |
| Applications |
| Powder Diffraction, Thin Film Analysis, Residual Stress Measurement,
Texture Analysis, Crystallography, Semiconductor Research,
Materials Science, Nanotechnology, Coatings, Bulk Materials,
Fibers, Polymers, Metals, Ceramics, Geological Samples,
Pharmaceutical Research, In-situ & Non-Ambient Measurements. |
| Standard Equipment & Features |
- TWIST-TUBE High Power X-Ray Source
- IµS Microfocus Source
- Turbo X-Ray Source (TXS)
- TRIO Automated Optics
- High Resolution Ge Monochromators
- D8 Precision Goniometer
- UMC Sample Stage
- Centric Eulerian Cradle (CEC)
- Pathfinder Plus Optics
- LYNXEYE XE-T Detector
- EIGER2 Hybrid Photon Counting Detector
- Automated Beam Geometry Switching
- DIFFRAC.DAVINCI Stage Integration
- External Chiller
|
| Machine Features |
| The BRUKER D8 DISCOVER is one of the industry’s most advanced modular X-ray diffraction platforms. Its configurable X-ray sources, automated optics, precision goniometer, high-resolution monochromators, multiple detector technologies, and comprehensive environmental testing capabilities provide outstanding performance for research laboratories, universities, semiconductor manufacturing, aerospace materials development, pharmaceutical analysis, metallurgy, nanotechnology, and industrial quality control. The system supports rapid switching between measurement configurations while maintaining exceptional accuracy, repeatability, and data quality. |